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Dalton Trans., 2009, 9058–9067; (i) L. Annunziata, G. Li and
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X-ray crystallographic analysis
Diffraction data were measured on a Nonius CAD-4, SmartCCD,
or Nonius KappaCCD diffractometer with graphite-monochro-
matized Mo Kα radiation (λ = 0.7103 Å). No significant decay
was observed during the data collection. The data were processed
on a PC using the SHELXTL refinement software package.16
The structures were solved using the direct method and refined
by full-matrix least-squares on the F2 value.
All the non-hydrogen atoms were refined anisotropically.
Hydrogen atoms were identified by calculation and refined using
a riding mode, and their contributions to structure factors were
included. Atomic scattering factors were taken from the Inter-
national Tables of Crystallographic Data, Vol IV. Computing
programs are from the NRC VAX package.17 Crystallographic
data and selected atomic coordinates and bond parameters are
collected in Tables 4 and 5. The rest of the data are supplied in
the ESI.†
6 R. F. Borch, M. D. Bernstein and H. D. Durst, J. Am. Chem. Soc., 1971,
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J. Raymond, E. J. Bilsky, M. D. Aceto, E. L. May, L. S. Harris, A. Coop,
C. M. Dersch, R. B. Rothman, A. E. Jacobson and K. C. Rice, Org.
Biomol. Chem., 2007, 5, 1177–1190.
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S. White and M. Brookhart, Macromolecules, 2000, 33, 2320–2334;
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Acknowledgements
We thank the National Science Council, Taiwan ROC, for the
financial support, and also thank Nan-Ya Plastic Co. for the
generous supply of MAO.
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